A novel technique enabling ultrafast nondestructive
characterization of multilayer dielectric structures is proposed.
Actual estimations indicate that the data acquisition performance
of electronic measurement systems of today allow deep submillimeter
depth resolution, almost independently of the frequency.
For a 10 GHz signal, e.g., this corresponds to significant subwavelength
depth resolution. By means of a novel blind analysis
method of the time-dependent reflected electromagnetic (EM) signal,
detailed information on the geometrical and EM parameters
such as the complex valued dielectric permittivity and magnetic
susceptibility of each layer of the structure can be extracted.
We validate the novel technique for different materials in the
10 GHz range and compare the results obtained with S-parameter
measurements in the 9.5–10.5 GHz range using a vector network
analyzer. We will discuss the impact of nonidealities on the
accuracy of the retrieved parameters. The novel technique has the
potential for deployment in a wide range of applications ranging
from the piping industry, wind energy industry, automotive,
biotechnology, food industry, pharmacy, and so on.
Original languageEnglish
Pages (from-to)2171-2184
Number of pages14
JournalIEEE Transactions on Microwave Theory and Techniques
Volume65
Issue number6
StatePublished - 10 Mar 2017

    Research areas

  • Blind method/algorithm electromagnetic (EM) wave, geometrical and EMs characteristics, indirect trigger, multilayer structures (MLSs), nondestructive testing (NDT), nonmetallic., electromagnetic (EM) wave , geometrical and EMs characteristics, indirect trigger, multilayer structures (MLSs), nondestructive testing (NDT), nonmetallic

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