This paper evaluates the applicability of an innovative strategy for applying compressed Sensing (CS) on Synthetic Aperture Radar (SAR) imaging, in the mm-wave range, using prior or structural side information. The studied technique adds the side information to the conventional CS minimization problem using an l1-l1 minimization approach, allowing for lower sub-Nyquist sampling than standard CS predicts. The applicability of this strategy on ultra-wideband SAR measurements is tested through simulations and real Non-Destructive Testing (NDT) experiments on a 3D-printed polymer object.
Original languageEnglish
Title of host publicationIEEE Radar Conference 2016
PublisherIEEE
Pages1-5
Number of pages5
ISBN (Electronic)978-1-5090-0863-6
Publication statusPublished - May 2016
Event2016 IEEE Radar Conference, RadarConf 2016 - Philadelphia, United States
Duration: 2 May 20166 May 2016

Conference

Conference2016 IEEE Radar Conference, RadarConf 2016
CountryUnited States
CityPhiladelphia
Period2/05/166/05/16

    Research areas

  • Compressed sensing, Synthetic Aperture Radar, Non-Destructive Testing

ID: 22038746