This paper describes two optimization algorithms used to calculate the complex permittivity and the
thickness of individual dielectric layers of multilayered structure in the W-band. The algorithms are the
genetic algorithm (GA) and the sequential quadratic programming (SQP) based on the quasi-Newton
method BFGS (BFGS-SQP); the setup procedure of both algorithms is presented. A quasi-optical free
space measurement system is used to measure the reflection and the transmission coefficients. The
performance of the measurement setup is first tested using different single layer slabs. A detailed
comparison between the two algorithms is reported.
Original languageEnglish
Pages (from-to)13-21
Number of pages9
JournalIET Science, Measurement & Technology
Issue number1
Publication statusPublished - 1 Jan 2009

    Research areas

  • Genetic algorithm (GA), Sequential quadratic programming (SQP)

ID: 1695136