Description

HArd X-ray PhotoElectron Spectroscopy (HAXPES) is a rapidly evolving analytical method providing much needed insight into material interactions at surfaces and burried interfaces. HAXPES will be implemented as novel analysis technique in Flanders to boost applied research in areas like batteries, photovoltaics, catalysis,
corrosion prevention and semiconductor devices.
Short titleHAXPES
AcronymHERC49
StatusActive
Effective start/end date1/05/1830/04/22

    Flemish discipline codes

  • Surface engineering

    Research areas

  • materials research

ID: 45329835