Evi Van Nechel (Recipient)

Second best paper award for "Efficient design optimization and variability analysis of defected ground structure filters using metamodels"
Awarded date13 Dec 2017
Degree of recognitionInternational
Granting OrganisationsIEEE MTT-S International Microwave and RF Conference
Awarded at eventInternational Microwave and RF Conference

ID: 36731706