1. 2017
  2. Photonics enhanced sensors for food monitoring: Part 3

    Meulebroeck, W., Thienpont, H. & Ottevaere, P. D. I. H., Oct 2017, In : IEEE Instrum. Meas. Mag.. 20, 5, p. 46-55 10 p., 8036698.

    Research output: Contribution to journalArticle

  3. Studies on the sparsifying operator in compressive digital holography

    Bettens, S., Yan, H., Blinder, D., Ottevaere, H., Schretter, C. & Schelkens, P., 7 Aug 2017, In : Optics Express. 25, 16, p. 18656-18676 21 p.

    Research output: Contribution to journalArticle

  4. Optofluidic chip for single-beam optical trapping of particles enabling confocal raman measurements

    De Coster, D., Liu, Q., Vervaeke, M., Van Erps, J. A., Missine, J., Thienpont, H. & Ottevaere, H., 1 Mar 2017, In : IEEE J. Sel. Top. Quantum Electron.. 23, 2, 9 p., 5500109.

    Research output: Contribution to journalArticle

  5. Photonics enhanced sensors for food monitoring: part 2

    Meulebroeck, W., Thienpont, H. & Ottevaere, H., Feb 2017, In : IEEE Instrumentation & Measurement Magazine. 20, 1, p. 31-37 7 p., 7864547.

    Research output: Contribution to journalArticle

  6. A Roadmap Towards Holographic Television From a Signal Processing Perspective

    Schelkens, P., Ahar, A., Bettens, S., Bilous, V., Birnbaum, T., Blinder, D., Ottevaere, P. D. I. H., Munteanu, A., Schretter, C. & Symeonidou, A., 1 Jan 2017, Digital Holography and Three-Dimensional Imaging, DH 2017. Optical Society of America, Vol. Part F47-DH 2017. 3 p. M2B.1. (OSA Technical Digest ).

    Research output: Chapter in Book/Report/Conference proceedingConference paper

  7. Integrated confocal Raman probe combined with a free-form reflector based lab-on-chip

    Liu, Q., Barbieri, G., Thienpont, H. & Ottevaere, P. D. I. H., 2017, Optical System Alignment, Tolerancing, and Verification XI. Sasian, J. & Youngworth, R. N. (eds.). SPIE, Vol. 10377 . 9 p. 1037706. (Proceedings of SPIE).

    Research output: Chapter in Book/Report/Conference proceedingConference paper

  8. Optofluidic chips for Raman spectroscopy and optical trapping

    Ottevaere, P. D. I. H., Liu, Q., De Coster, D., Van Erps, J. A., Vervaeke, M. & Thienpont, H., 2017, 2017 Conference on Lasers and Electro-Optics (CLEO). IEEE, Piscataway, NJ, USA, 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference paper

  9. Revealing features of different optical shaping technologies by a point diffraction interferometer

    Voznesenskiy, N., Voznesenskaia, M., Jha, D., Ottevaere, H., Kujawinska, M., Trusiak, M. & Lizdotewski, K., 2017, Optical Measurement Systems for Industrial Inspection X. Lehmann, P., Goncalves, A. A. & Osten, W. (eds.). SPIE, Vol. 10329. 8 p. 103293X . (Proceedings of SPIE).

    Research output: Chapter in Book/Report/Conference proceedingConference paper

  10. 2016
  11. Photonics enhances sensors for food monitoring: part 1

    Meulebroeck, W., Thienpont, H. & Ottevaere, H., Dec 2016, In : IEEE Instrumentation & Measurement Magazine. 19, 6, p. 35-45

    Research output: Contribution to journalArticle

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